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544-116-1A Mitutoyo Bench-Top Laser Scan Micrometer Laser Scan Micrometer Mitutoyo

544-116-1A Mitutoyo Bench-Top Laser Scan Micrometer

$ 10,200.00$ 8,721.00

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Product Description

Mitutoyo Bench-Top Laser Scan Micrometer LSM-9506

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  • Continental US ONLY

Features include...

  • With a design that integrates the display section and measuring section into one unit, this instrument is best suited for making bench-top measurements in an inspection room.
  • A statistical calculation function is provided.
  • Standard RS-232C and SPC output interfaces are provided as standard.

Specifications include...

  • 0.02" - 2.36" / 0.5-60mm Measuring Range
  • Selectable Resolutions...
    • 0.000002" - 0.005"
    • 0.00005mm - 0.1mm
  • 1600 scans per second
  • Repeatability: 0.6um (.00003")

High scanning rate (1600 scans/sec) and high accuracy, non-contact measuring systems, the laser scan micrometer (LSM) inspects small, fragile work pieces at a high temperature, even while in motion or vibrating.

A laser beam is directed at a polygonal mirror rotating at high speed in exact synchronism with highly stable pulses from the system clock. The reflected beam is rotating clockwise as it sweeps across the input surface of a collimating lens but changes direction to be always horizontal after the lens exit surface as it moves, or scans, downward. This horizontal beam enters the measuring space and, with no workpiece present, reaches a receiver via a condensing lens to produce an output signal. When a simple workpiece (a cylinder, for example) is put into the measuring space the beam will be interrupted for a time during its sweep and this time, as indicated by clock pulses occurring while the receiver signal is absent, is proportional to the workpiece dimension in the downward direction.

Each transition between the receiver detecting the beam and then not detecting the beam, or vice versa, is called an edge and marks the start and/or end of measuring sections called segments, so that the differences in position of these edges define the length of each segment. The edges and segments generated by a workpiece are numbered sequentially by the instrument and are used when writing programs to extract the required dimensional data.

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